[PDF.01ow] 1999 IEEE International Symposium on Defect and Fault Tolerance in Vlsi Systems (Dft '99): November 1-3, 1999 Albuquerque, New Mexico: Proceedings

1999 IEEE International Symposium on Defect and Fault Tolerance in Vlsi Systems (Dft '99): November 1-3, 1999 Albuquerque, New Mexico: Proceedings

[PDF.fq80] 1999 IEEE International Symposium on Defect and Fault Tolerance in Vlsi Systems (Dft '99): November 1-3, 1999 Albuquerque, New Mexico: Proceedings

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 |  1999-01 | Original language:English | PDF # 1 |  8.75 x6.00 x1.00l, | File type: PDF | 375 pages

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These proceedings cover: yield; testing techniques; built-in self-test architectures; fault modelling and simulation; design for testing; self-checking processing units and systems; self-checking memories and interconnections; diagnosis; and reconfiguration.

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