[PDF.20ef] Defect and Fault Tolerance in Vlsi Systems (Dft 2000): 2000 IEEE International Symposium

Defect and Fault Tolerance in Vlsi Systems (Dft 2000): 2000 IEEE International Symposium

[PDF.fd65] Defect and Fault Tolerance in Vlsi Systems (Dft 2000): 2000 IEEE International Symposium

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 | #19135826 in Books |  2000-11 | Original language:English |  8.75 x6.00 x1.00l, | File type: PDF | 438 pages

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This work constitutes the proceedings of the 2000 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2000). Subjects addressed include: yield analysis and modelling; wafer scale/large area systems; fault-tolerant systems; tesitng strategies; and more.

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