[PDF.96wj] Hot Carrier Design Considerations for MOS Devices and Circuits
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Hot Carrier Design Considerations for MOS Devices and Circuits
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[PDF.oq24] Hot Carrier Design Considerations for MOS Devices and Circuits
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| #6516830 in Books | 1992-07-02 | Original language:English | PDF # 1 | File type: PDF | 334 pages|
As device dimensions decrease, hot-carrier effects, which are due mainly to the presence of a high electric field inside the device, are becoming a major design concern. On the one hand, the detrimental effects-such as transconductance degradation and threshold shift-need to be minimized or, if possible, avoided altogether. On the other hand, performance such as the programming efficiency of nonvolatile memories or the carrier velocity inside the devices-need to be ...
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