[PDF.16fs] New Approaches to Image Processing based Failure Analysis of Nano-Scale ULSI Devices (Micro and Nano Technologies)
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New Approaches to Image Processing based Failure Analysis of Nano-Scale ULSI Devices (Micro and Nano Technologies)
Zeev Zalevsky, Pavel Livshits, Eran Gur
[PDF.ne87] New Approaches to Image Processing based Failure Analysis of Nano-Scale ULSI Devices (Micro and Nano Technologies)
New Approaches to Image Zeev Zalevsky, Pavel Livshits, Eran Gur epub New Approaches to Image Zeev Zalevsky, Pavel Livshits, Eran Gur pdf download New Approaches to Image Zeev Zalevsky, Pavel Livshits, Eran Gur pdf file New Approaches to Image Zeev Zalevsky, Pavel Livshits, Eran Gur audiobook New Approaches to Image Zeev Zalevsky, Pavel Livshits, Eran Gur book review New Approaches to Image Zeev Zalevsky, Pavel Livshits, Eran Gur summary
| #12070892 in Books | 2013-12-02 | 2013-11-18 | Original language:English | PDF # 1 | 9.00 x.25 x6.00l,.35 | File type: PDF | 110 pages|
New Approaches to Image Processing Based Failure Analysis of Nano-Scale ULSI Devices introduces the reader to transmission and scanning microscope image processing for metal and non-metallic microstructures.
Engineers and scientists face the pressing problem in ULSI development and quality assurance: microscopy methods can’t keep pace with the continuous shrinking of feature size in microelectronics. Nanometer scale sizes are below the resolution ...
You can specify the type of files you want, for your device.New Approaches to Image Processing based Failure Analysis of Nano-Scale ULSI Devices (Micro and Nano Technologies) | Zeev Zalevsky, Pavel Livshits, Eran Gur.Not only was the story interesting, engaging and relatable, it also teaches lessons.