[PDF.70te] Optical Characterization of Epitaxial Semiconductor Layers
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Optical Characterization of Epitaxial Semiconductor Layers
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[PDF.uz67] Optical Characterization of Epitaxial Semiconductor Layers
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| #5038771 in Books | 1995-12-13 | Original language:English | PDF # 1 | 9.75 x6.75 x.75l,.0 | File type: PDF | 429 pages||From the Back Cover|The last decade has witnessed an explosive development in the growth of expitaxial layers and structures with atomic-scale dimensions. This progress has created new demands for the characterization of those stuctures. Various methods have bee
The characterization of epitaxial layers and their surfaces has benefitted a lot from the enormous progress of optical analysis techniques during the last decade. In particular, the dramatic improvement of the structural quality of semiconductor epilayers and heterostructures results to a great deal from the level of sophistication achieved with such analysis techniques. First of all, optical techniques are nondestructive and their sensitivity has been improved to such a...
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