[PDF.89sy] Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices (Selected Topics in Electronics and Systems)

Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices (Selected Topics in Electronics and Systems)

[PDF.bm00] Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices (Selected Topics in Electronics and Systems)

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 | #4993046 in Books |  2004-07-29 | Original language:English | PDF # 1 |  9.00 x.79 x6.00l,1.60 | File type: PDF | 348 pages

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|| |"Ron Schrimpf and Dan Fleetwood are world renowned experts in radiation effects. This book is a great resource ..."

This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (Mos), and compound semiconductor technologies are discussed. I...

You can specify the type of files you want, for your device.Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices (Selected Topics in Electronics and Systems)   |  Daniel M. Fleetwood.Not only was the story interesting, engaging and relatable, it also teaches lessons.

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