[PDF.74cz] Stress-Induced Phenomena in Metallization: Tenth International Workshop on Stress-Induced Phenomena in Metallization (AIP Conference Proceedings / Materials Physics and Applications)
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Stress-Induced Phenomena in Metallization: Tenth International Workshop on Stress-Induced Phenomena in Metallization (AIP Conference Proceedings / Materials Physics and Applications)
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Stress-Induced Phenomena in Metallization: From American Institute of Physics epub Stress-Induced Phenomena in Metallization: From American Institute of Physics pdf download Stress-Induced Phenomena in Metallization: From American Institute of Physics pdf file Stress-Induced Phenomena in Metallization: From American Institute of Physics audiobook Stress-Induced Phenomena in Metallization: From American Institute of Physics book review Stress-Induced Phenomena in Metallization: From American Institute of Physics summary
| #13890323 in Books | 2009-07-02 | Original language:English | PDF # 1 | 9.40 x.70 x6.50l,1.10 | File type: PDF | 242 pages||About the Author|fm.author_biographical_note4
Dr Ehrenfried Zschech is manager of the Materials Analysis Department at AMD Saxony LLC & Co. KG in Dresden, Germany. Advanced Microdevices (AMD) is a global manufacturer of microprocessors and other integ
Stress-induced voiding and electromigration have emerged to become key reliability problems for submicron interconnect metallization. This has led to the First International Stress Workshop on Stress-Induced Phenomena in Metallization held at Cornell University in 1991, and the series has continued to the Tenth Stress Workshop held at The University of Texas at Austin on November 5-7, 2008. This book contains the proceedings of the 10th Stress Workshop. Following the sp...
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