[PDF.01ht] Testing and Diagnosis of VLSI and ULSI (Nato Science Series E:) (Volume 151)

Testing and Diagnosis of VLSI and ULSI (Nato Science Series E:) (Volume 151)

[PDF.el71] Testing and Diagnosis of VLSI and ULSI (Nato Science Series E:) (Volume 151)

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 | #14468020 in Books |  Ingramcontent |  2011-09-28 |  2013-10-04 | Original language:English | PDF # 1 |  9.25 x1.23 x6.10l,1.66 | File type: PDF | 544 pages

 | Testing and Diagnosis of VLSI and ULSI Nato Science Series E Volume 151

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This volume contains a collection of papers presented at the NATO Advanced Study Institute on ·Testing and Diagnosis of VLSI and ULSI" held at Villa Olmo, Como (Italy) June 22 -July 3,1987. High Density technologies such as Very-Large Scale Integration (VLSI), Wafer Scale Integration (WSI) and the not-so-far promises of Ultra-Large Scale Integration (ULSI), have exasperated the problema associated with the testing and diagnosis of these devices and systema. Tradit...

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