[PDF.10nx] Wafer Level Reliability of Advanced CMOS Devices and Processes

Wafer Level Reliability of Advanced CMOS Devices and Processes

[PDF.ex99] Wafer Level Reliability of Advanced CMOS Devices and Processes

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 | #7234991 in Books |  Nova Science Pub Inc |  2008-08-01 | Original language:English | PDF # 1 |  10.50 x7.50 x.50l,.0 | File type: PDF | 195 pages

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The definition from SEMATECH of wafer level reliability test is: a methodology to assess the reliability impact of tools and processes by testing mechanism-specific test structures under accelerated conditions during device processing. This text discusses all all items of wafer level reliability of CMOS devices and processes.

You easily download any file type for your device.Wafer Level Reliability of Advanced CMOS Devices and Processes   |  Yi Zhao. I have read it a couple of times and even shared with my family members. Really good. Couldnt put it down.

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