[PDF.86gn] Vlsi Test Symposium (Vts 2001): 19th IEEE Symposium

Vlsi Test Symposium (Vts 2001): 19th IEEE Symposium

[PDF.fs70] Vlsi Test Symposium (Vts 2001): 19th IEEE Symposium

Vlsi Test Symposium (Vts  India) International Conference on VLSI Design (14th : 2001 : Bangalore epub
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 |  2001-07 | Original language:English | PDF # 1 |  10.50 x8.25 x1.00l, | File type: PDF | 414 pages

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Topics include: BIST techniques; diagnosis methods; test data compression; synthesis and design for testability; diagnosis and verification ATPG; defect analysis and IDDx diagnosis; SoC testing; self-test techniques; memory diagnosis; novel ATPG techniques; fault modelling and BIST evaluation.

You can specify the type of files you want, for your device.Vlsi Test Symposium (Vts 2001): 19th IEEE Symposium   |  India) International Conference on VLSI Design (14th : 2001 : Bangalore. I was recommended this book by a dear friend of mine.

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