[PDF.20gm] VLSI Test Symposium (VTS '98), 16th IEEE

VLSI Test Symposium (VTS '98), 16th IEEE

[PDF.yz47] VLSI Test Symposium (VTS '98), 16th IEEE

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 | #17141501 in Books |  1998-05 | Original language:English |  11.00 x8.75 x1.00l, | File type: PDF | 500 pages

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This work contains the proceedings from the 16th IEEE VLSI Test Symposium. Subjects covered include: core and processor test; RAM test; BIST; current testing techniques; delay test and diagnosis; fault modeling and parametric test; and analog test sequential circuits test concurrent checking.

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